We need your consent to use the individual data so that you can see information about your interests, among other things. Click "OK" to give your consent.
Test Method for Crystalographic Perfection of Silicon by Preferential Etch Techniques (Withdrawn 1998)
Designation standards: ASTM F47-94
Note: WITHDRAWN
SKU: NS-55438
The number of pages: 11
Approximate weight : 33 g (0.07 lbs)
Country: American technical standard
Category: Technical standards ASTM
Keywords:
ICS Number Code 77.040.30 (Chemical analysis of metals)
Latest update: 2024-05-17 (Number of items: 2 902 148)
© Copyright 2024 NORMSERVIS s.r.o.